3D Plant cell architecture of Arabidopsis thaliana (Brassicaceae) using focused ion beam–scanning electron microscopy(1)

• Premise of the study: Focused ion beam–scanning electron microscopy (FIB-SEM) combines the ability to sequentially mill the sample surface and obtain SEM images that can be used to create 3D renderings with micron-level resolution. We have applied FIB-SEM to study Arabidopsis cell architecture. Th...

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Detalles Bibliográficos
Autores principales: Bhawana, Miller, Joyce L., Cahoon, A. Bruce
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Botanical Society of America 2014
Materias:
Application Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4103436/
https://www.ncbi.nlm.nih.gov/pubmed/25202629
http://dx.doi.org/10.3732/apps.1300090

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4103436/
https://www.ncbi.nlm.nih.gov/pubmed/25202629
http://dx.doi.org/10.3732/apps.1300090

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