Nanoindentation of GaSe thin films

The structural and nanomechanical properties of GaSe thin films were investigated by means of X-ray diffraction (XRD) and nanoindentation techniques. The GaSe thin films were deposited on Si(111) substrates by pulsed laser deposition. XRD patterns reveal only the pure (000 l)-oriented reflections or...

Descripción completa

Detalles Bibliográficos
Autores principales: Jian, Sheng-Rui, Ku, Shin-An, Luo, Chih-Wei, Juang, Jenh-Yih
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer 2012
Materias:
Nano Express
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4113972/
https://www.ncbi.nlm.nih.gov/pubmed/22804961
http://dx.doi.org/10.1186/1556-276X-7-403

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4113972/
https://www.ncbi.nlm.nih.gov/pubmed/22804961
http://dx.doi.org/10.1186/1556-276X-7-403

Ejemplares similares