Frequency Function in Atomic Force Microscopy Applied to a Liquid Environment

Scanning specimens in liquids using commercial atomic force microscopy (AFM) is very time-consuming due to the necessary try-and-error iteration for determining appropriate triggering frequencies and probes. In addition, the iteration easily contaminates the AFM tip and damages the samples, which co...

Descripción completa

Detalles Bibliográficos
Autor principal: Shih, Po-Jen
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2014
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4118394/
https://www.ncbi.nlm.nih.gov/pubmed/24865882
http://dx.doi.org/10.3390/s140609369

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4118394/
https://www.ncbi.nlm.nih.gov/pubmed/24865882
http://dx.doi.org/10.3390/s140609369

Ejemplares similares