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Frequency Function in Atomic Force Microscopy Applied to a Liquid Environment
Scanning specimens in liquids using commercial atomic force microscopy (AFM) is very time-consuming due to the necessary try-and-error iteration for determining appropriate triggering frequencies and probes. In addition, the iteration easily contaminates the AFM tip and damages the samples, which co...
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
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MDPI
2014
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4118394/ https://www.ncbi.nlm.nih.gov/pubmed/24865882 http://dx.doi.org/10.3390/s140609369 |