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Processing of X-ray snapshots from crystals in random orientations
A functional expression is introduced that relates scattered X-ray intensities from a still or a rotation snapshot to the corresponding structure-factor amplitudes. The new approach was implemented in the program nXDS for processing monochromatic diffraction images recorded by a multi-segment detect...
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
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International Union of Crystallography
2014
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4118830/ https://www.ncbi.nlm.nih.gov/pubmed/25084339 http://dx.doi.org/10.1107/S1399004714013534 |