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Quantum-enhanced metrology for multiple phase estimation with noise

We present a general quantum metrology framework to study the simultaneous estimation of multiple phases in the presence of noise as a discretized model for phase imaging. This approach can lead to nontrivial bounds of the precision for multiphase estimation. Our results show that simultaneous estim...

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Detalles Bibliográficos
Autores principales: Yue, Jie-Dong, Zhang, Yu-Ran, Fan, Heng
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2014
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4123202/
https://www.ncbi.nlm.nih.gov/pubmed/25090445
http://dx.doi.org/10.1038/srep05933