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Beam-induced motion correction for sub-megadalton cryo-EM particles
In electron cryo-microscopy (cryo-EM), the electron beam that is used for imaging also causes the sample to move. This motion blurs the images and limits the resolution attainable by single-particle analysis. In a previous Research article (Bai et al., 2013) we showed that correcting for this motion...
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
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eLife Sciences Publications, Ltd
2014
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4130160/ https://www.ncbi.nlm.nih.gov/pubmed/25122622 http://dx.doi.org/10.7554/eLife.03665 |