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Copper pillar and memory characteristics using Al(2)O(3) switching material for 3D architecture

A novel idea by using copper (Cu) pillar is proposed in this study, which can replace the through-silicon-vias (TSV) technique in future three-dimensional (3D) architecture. The Cu pillar formation under external bias in an Al/Cu/Al(2)O(3)/TiN structure is simple and low cost. The Cu pillar is forme...

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Detalles Bibliográficos
Autores principales: Maikap, Siddheswar, Panja, Rajeswar, Jana, Debanjan
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer 2014
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4130702/
https://www.ncbi.nlm.nih.gov/pubmed/25136279
http://dx.doi.org/10.1186/1556-276X-9-366