A Novel Prediction Method about Single Components of Analog Circuits Based on Complex Field Modeling

Few researches pay attention to prediction about analog circuits. The few methods lack the correlation with circuit analysis during extracting and calculating features so that FI (fault indicator) calculation often lack rationality, thus affecting prognostic performance. To solve the above problem,...

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Detalles Bibliográficos
Autores principales: Zhou, Jingyu, Tian, Shulin, Yang, Chenglin
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Hindawi Publishing Corporation 2014
Materias:
Research Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4132338/
https://www.ncbi.nlm.nih.gov/pubmed/25147853
http://dx.doi.org/10.1155/2014/530942

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4132338/
https://www.ncbi.nlm.nih.gov/pubmed/25147853
http://dx.doi.org/10.1155/2014/530942

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