Nano-artifact metrics based on random collapse of resist

Artifact metrics is an information security technology that uses the intrinsic characteristics of a physical object for authentication and clone resistance. Here, we demonstrate nano-artifact metrics based on silicon nanostructures formed via an array of resist pillars that randomly collapse when ex...

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Detalles Bibliográficos
Autores principales: Matsumoto, Tsutomu, Hoga, Morihisa, Ohyagi, Yasuyuki, Ishikawa, Mikio, Naruse, Makoto, Hanaki, Kenta, Suzuki, Ryosuke, Sekiguchi, Daiki, Tate, Naoya, Ohtsu, Motoichi
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2014
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4139945/
https://www.ncbi.nlm.nih.gov/pubmed/25142401
http://dx.doi.org/10.1038/srep06142

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4139945/
https://www.ncbi.nlm.nih.gov/pubmed/25142401
http://dx.doi.org/10.1038/srep06142

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