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Nano-artifact metrics based on random collapse of resist
Artifact metrics is an information security technology that uses the intrinsic characteristics of a physical object for authentication and clone resistance. Here, we demonstrate nano-artifact metrics based on silicon nanostructures formed via an array of resist pillars that randomly collapse when ex...
Autores principales: | Matsumoto, Tsutomu, Hoga, Morihisa, Ohyagi, Yasuyuki, Ishikawa, Mikio, Naruse, Makoto, Hanaki, Kenta, Suzuki, Ryosuke, Sekiguchi, Daiki, Tate, Naoya, Ohtsu, Motoichi |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Publishing Group
2014
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4139945/ https://www.ncbi.nlm.nih.gov/pubmed/25142401 http://dx.doi.org/10.1038/srep06142 |
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