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Gate leakage current induced trapping in AlGaN/GaN Schottky-gate HFETs and MISHFETs
This study examined the correlation between the off-state leakage current and dynamic on-resistance (R(ON)) transients in AlGaN/GaN heterostructure field-effect transistors (HFETs) with and without a gate insulator under various stress conditions. The R(ON) transients in a Schottky-gate HFET (SGHFET...
Autores principales: | Liao, Wen-Chia, Chen, Yan-Lun, Chen, Zheng-Xing, Chyi, Jen-Inn, Hsin, Yue-Ming |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Springer
2014
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4160917/ https://www.ncbi.nlm.nih.gov/pubmed/25258601 http://dx.doi.org/10.1186/1556-276X-9-474 |
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