A Test Data Compression Scheme Based on Irrational Numbers Stored Coding

Test question has already become an important factor to restrict the development of integrated circuit industry. A new test data compression scheme, namely irrational numbers stored (INS), is presented. To achieve the goal of compress test data efficiently, test data is converted into floating-point...

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Detalles Bibliográficos
Autores principales: Wu, Hai-feng, Cheng, Yu-sheng, Zhan, Wen-fa, Cheng, Yi-fei, Wu, Qiong, Zhu, Shi-juan
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Hindawi Publishing Corporation 2014
Materias:
Research Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4166428/
https://www.ncbi.nlm.nih.gov/pubmed/25258744
http://dx.doi.org/10.1155/2014/982728

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4166428/
https://www.ncbi.nlm.nih.gov/pubmed/25258744
http://dx.doi.org/10.1155/2014/982728

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