A Test Data Compression Scheme Based on Irrational Numbers Stored Coding

Test question has already become an important factor to restrict the development of integrated circuit industry. A new test data compression scheme, namely irrational numbers stored (INS), is presented. To achieve the goal of compress test data efficiently, test data is converted into floating-point...

Descripción completa

Detalles Bibliográficos
Autores principales: Wu, Hai-feng, Cheng, Yu-sheng, Zhan, Wen-fa, Cheng, Yi-fei, Wu, Qiong, Zhu, Shi-juan
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Hindawi Publishing Corporation 2014
Materias:
Research Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4166428/
https://www.ncbi.nlm.nih.gov/pubmed/25258744
http://dx.doi.org/10.1155/2014/982728
Descripción
Sumario:Test question has already become an important factor to restrict the development of integrated circuit industry. A new test data compression scheme, namely irrational numbers stored (INS), is presented. To achieve the goal of compress test data efficiently, test data is converted into floating-point numbers, stored in the form of irrational numbers. The algorithm of converting floating-point number to irrational number precisely is given. Experimental results for some ISCAS 89 benchmarks show that the compression effect of proposed scheme is better than the coding methods such as FDR, AARLC, INDC, FAVLC, and VRL.

Ejemplares similares