Spatially-resolved mapping of history-dependent coupled electrochemical and electronical behaviors of electroresistive NiO

Bias-induced oxygen ion dynamics underpins a broad spectrum of electroresistive and memristive phenomena in oxide materials. Although widely studied by device-level and local voltage-current spectroscopies, the relationship between electroresistive phenomena, local electrochemical behaviors, and mic...

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Detalles Bibliográficos
Autores principales: Sugiyama, Issei, Kim, Yunseok, Jesse, Stephen, Strelcov, Evgheni, Kumar, Amit, Tselev, Alexander, Rahani, Ehasan Kabiri, Shenoy, Vivek B., Yamamoto, Takahisa, Shibata, Naoya, Ikuhara, Yuichi, Kalinin, Sergei V.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2014
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4205888/
https://www.ncbi.nlm.nih.gov/pubmed/25335689
http://dx.doi.org/10.1038/srep06725

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4205888/
https://www.ncbi.nlm.nih.gov/pubmed/25335689
http://dx.doi.org/10.1038/srep06725

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