A study on the consequence of swift heavy ion irradiation of Zn–silica nanocomposite thin films: electronic sputtering

Zn–silica nanocomposite thin films with varying Zn metal content, deposited by atom beam sputtering technique were subjected to 100 MeV Ag ion irradiation. Rutherford backscattering spectrometry reveals the loss of Zn with irradiation, which is observed to be greater from thin films with lower Zn co...

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Detalles Bibliográficos
Autores principales: Pannu, Compesh, Singh, Udai B, Agarwal, Dinesh C, Khan, Saif A, Ojha, Sunil, Chandra, Ramesh, Amekura, Hiro, Kabiraj, Debdulal, Avasthi, Devesh K
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Beilstein-Institut 2014
Materias:
Full Research Paper
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4222341/
https://www.ncbi.nlm.nih.gov/pubmed/25383280
http://dx.doi.org/10.3762/bjnano.5.179

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4222341/
https://www.ncbi.nlm.nih.gov/pubmed/25383280
http://dx.doi.org/10.3762/bjnano.5.179

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