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A study on the consequence of swift heavy ion irradiation of Zn–silica nanocomposite thin films: electronic sputtering
Zn–silica nanocomposite thin films with varying Zn metal content, deposited by atom beam sputtering technique were subjected to 100 MeV Ag ion irradiation. Rutherford backscattering spectrometry reveals the loss of Zn with irradiation, which is observed to be greater from thin films with lower Zn co...
| Autores principales: | , , , , , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Beilstein-Institut
2014
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4222341/ https://www.ncbi.nlm.nih.gov/pubmed/25383280 http://dx.doi.org/10.3762/bjnano.5.179 |