Strain analysis for the prediction of the preferential nucleation sites of stacked quantum dots by combination of FEM and APT

The finite elements method (FEM) is a useful tool for the analysis of the strain state of semiconductor heterostructures. It has been used for the prediction of the nucleation sites of stacked quantum dots (QDs), but often using either simulated data of the atom positions or two-dimensional experime...

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Detalles Bibliográficos
Autores principales: Hernández-Saz, Jesús, Herrera, Miriam, Duguay, Sébastien, Molina, Sergio I
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer 2013
Materias:
Nano Express
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4234348/
https://www.ncbi.nlm.nih.gov/pubmed/24308663
http://dx.doi.org/10.1186/1556-276X-8-513

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4234348/
https://www.ncbi.nlm.nih.gov/pubmed/24308663
http://dx.doi.org/10.1186/1556-276X-8-513

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