Optimum binary cut-off threshold of a diagnostic test: comparison of different methods using Monte Carlo technique

BACKGROUND: Using Monte Carlo simulations, we compare different methods (maximizing Youden index, maximizing mutual information, and logistic regression) for their ability to determine optimum binary cut-off thresholds for a ratio-scaled diagnostic test variable. Special attention is given to the st...

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Detalles Bibliográficos
Autores principales: Reibnegger, Gilbert, Schrabmair, Walter
Formato: Online Artículo Texto
Lenguaje:English
Publicado: BioMed Central 2014
Materias:
Research Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4253606/
https://www.ncbi.nlm.nih.gov/pubmed/25421000
http://dx.doi.org/10.1186/s12911-014-0099-1

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4253606/
https://www.ncbi.nlm.nih.gov/pubmed/25421000
http://dx.doi.org/10.1186/s12911-014-0099-1

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