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Optimum binary cut-off threshold of a diagnostic test: comparison of different methods using Monte Carlo technique
BACKGROUND: Using Monte Carlo simulations, we compare different methods (maximizing Youden index, maximizing mutual information, and logistic regression) for their ability to determine optimum binary cut-off thresholds for a ratio-scaled diagnostic test variable. Special attention is given to the st...
| Autores principales: | , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
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BioMed Central
2014
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4253606/ https://www.ncbi.nlm.nih.gov/pubmed/25421000 http://dx.doi.org/10.1186/s12911-014-0099-1 |