Real-time deflection and friction force imaging by bimorph-based resonance-type high-speed scanning force microscopy in the contact mode

We report herein an alternative high-speed scanning force microscopy method in the contact mode based on a resonance-type piezoelectric bimorph scanner. The experimental setup, the modified optical beam deflection scheme suitable for smaller cantilevers, and a high-speed control program for simultan...

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Detalles Bibliográficos
Autores principales: Cai, Wei, Fan, Haiyun, Zhao, Jianyong, Shang, Guangyi
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer 2014
Materias:
Nano Express
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4273677/
https://www.ncbi.nlm.nih.gov/pubmed/25593555
http://dx.doi.org/10.1186/1556-276X-9-665

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4273677/
https://www.ncbi.nlm.nih.gov/pubmed/25593555
http://dx.doi.org/10.1186/1556-276X-9-665

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