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Real-time deflection and friction force imaging by bimorph-based resonance-type high-speed scanning force microscopy in the contact mode
We report herein an alternative high-speed scanning force microscopy method in the contact mode based on a resonance-type piezoelectric bimorph scanner. The experimental setup, the modified optical beam deflection scheme suitable for smaller cantilevers, and a high-speed control program for simultan...
Autores principales: | Cai, Wei, Fan, Haiyun, Zhao, Jianyong, Shang, Guangyi |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Springer
2014
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4273677/ https://www.ncbi.nlm.nih.gov/pubmed/25593555 http://dx.doi.org/10.1186/1556-276X-9-665 |
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