Evolution of conductive filament and its impact on reliability issues in oxide-electrolyte based resistive random access memory

The electrochemical metallization cell, also referred to as conductive bridge random access memory, is considered to be a promising candidate or complementary component to the traditional charge based memory. As such, it is receiving additional focus to accelerate the commercialization process. To c...

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Detalles Bibliográficos
Autores principales: Lv, Hangbing, Xu, Xiaoxin, Liu, Hongtao, Liu, Ruoyu, Liu, Qi, Banerjee, Writam, Sun, Haitao, Long, Shibing, Li, Ling, Liu, Ming
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2015
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4293596/
https://www.ncbi.nlm.nih.gov/pubmed/25586207
http://dx.doi.org/10.1038/srep07764

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4293596/
https://www.ncbi.nlm.nih.gov/pubmed/25586207
http://dx.doi.org/10.1038/srep07764

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