Characterization of a next-generation piezo bimorph X-ray mirror for synchrotron beamlines

Piezo bimorph mirrors are versatile active optics used on many synchrotron beamlines. However, many bimorphs suffer from the ‘junction effect’: a periodic deformation of the optical surface which causes major aberrations to the reflected X-ray beam. This effect is linked to the construction of such...

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Detalles Bibliográficos
Autores principales: Alcock, Simon G., Nistea, Ioana, Sutter, John P., Sawhney, Kawal, Fermé, Jean-Jacques, Thellièr, Christophe, Peverini, Luca
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2015
Materias:
Research Papers
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4294023/
https://www.ncbi.nlm.nih.gov/pubmed/25537582
http://dx.doi.org/10.1107/S1600577514020025

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4294023/
https://www.ncbi.nlm.nih.gov/pubmed/25537582
http://dx.doi.org/10.1107/S1600577514020025

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