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Characterization of a next-generation piezo bimorph X-ray mirror for synchrotron beamlines
Piezo bimorph mirrors are versatile active optics used on many synchrotron beamlines. However, many bimorphs suffer from the ‘junction effect’: a periodic deformation of the optical surface which causes major aberrations to the reflected X-ray beam. This effect is linked to the construction of such...
Autores principales: | Alcock, Simon G., Nistea, Ioana, Sutter, John P., Sawhney, Kawal, Fermé, Jean-Jacques, Thellièr, Christophe, Peverini, Luca |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
International Union of Crystallography
2015
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4294023/ https://www.ncbi.nlm.nih.gov/pubmed/25537582 http://dx.doi.org/10.1107/S1600577514020025 |
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