X-ray diffraction strain analysis of a single axial InAs(1–x)P(x) nanowire segment

The spatial strain distribution in and around a single axial InAs(1–x)P(x) hetero-segment in an InAs nanowire was analyzed using nano-focused X-ray diffraction. In connection with finite-element-method simulations a detailed quantitative picture of the nanowire’s inhomogeneous strain state was achie...

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Detalles Bibliográficos
Autores principales: Keplinger, Mario, Mandl, Bernhard, Kriegner, Dominik, Holý, Václav, Samuelsson, Lars, Bauer, Günther, Deppert, Knut, Stangl, Julian
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2015
Materias:
Research Papers
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4294024/
https://www.ncbi.nlm.nih.gov/pubmed/25537589
http://dx.doi.org/10.1107/S160057751402284X

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4294024/
https://www.ncbi.nlm.nih.gov/pubmed/25537589
http://dx.doi.org/10.1107/S160057751402284X

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