Test Generation Algorithm for Fault Detection of Analog Circuits Based on Extreme Learning Machine

This paper proposes a novel test generation algorithm based on extreme learning machine (ELM), and such algorithm is cost-effective and low-risk for analog device under test (DUT). This method uses test patterns derived from the test generation algorithm to stimulate DUT, and then samples output res...

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Detalles Bibliográficos
Autores principales: Zhou, Jingyu, Tian, Shulin, Yang, Chenglin, Ren, Xuelong
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Hindawi Publishing Corporation 2014
Materias:
Research Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4295145/
https://www.ncbi.nlm.nih.gov/pubmed/25610458
http://dx.doi.org/10.1155/2014/740838

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4295145/
https://www.ncbi.nlm.nih.gov/pubmed/25610458
http://dx.doi.org/10.1155/2014/740838

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