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Test Generation Algorithm for Fault Detection of Analog Circuits Based on Extreme Learning Machine
This paper proposes a novel test generation algorithm based on extreme learning machine (ELM), and such algorithm is cost-effective and low-risk for analog device under test (DUT). This method uses test patterns derived from the test generation algorithm to stimulate DUT, and then samples output res...
| Autores principales: | , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Hindawi Publishing Corporation
2014
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4295145/ https://www.ncbi.nlm.nih.gov/pubmed/25610458 http://dx.doi.org/10.1155/2014/740838 |