Revealing the flexoelectricity in the mixed-phase regions of epitaxial BiFeO(3) thin films

Understanding the elastic response on the nanoscale phase boundaries of multiferroics is an essential issue in order to explain their exotic behaviour. Mixed-phase BiFeO(3) films, epitaxially grown on LaAlO(3) (001) substrates, have been investigated by means of scanning probe microscopy to characte...

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Detalles Bibliográficos
Autores principales: Cheng, Cheng-En, Liu, Heng-Jui, Dinelli, Franco, Chen, Yi-Chun, Chang, Chen-Shiung, Chien, Forest Shih-Sen, Chu, Ying-Hao
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2015
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4308693/
https://www.ncbi.nlm.nih.gov/pubmed/25627445
http://dx.doi.org/10.1038/srep08091

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4308693/
https://www.ncbi.nlm.nih.gov/pubmed/25627445
http://dx.doi.org/10.1038/srep08091

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