High-frequency multimodal atomic force microscopy

Multifrequency atomic force microscopy imaging has been recently demonstrated as a powerful technique for quickly obtaining information about the mechanical properties of a sample. Combining this development with recent gains in imaging speed through small cantilevers holds the promise of a convenie...

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Detalles Bibliográficos
Autores principales: Nievergelt, Adrian P, Adams, Jonathan D, Odermatt, Pascal D, Fantner, Georg E
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Beilstein Institute 2014
Materias:
Full Research Paper
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4311654/
https://www.ncbi.nlm.nih.gov/pubmed/25671141
http://dx.doi.org/10.3762/bjnano.5.255

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4311654/
https://www.ncbi.nlm.nih.gov/pubmed/25671141
http://dx.doi.org/10.3762/bjnano.5.255

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