Growth of an Ultrathin Zirconia Film on Pt(3)Zr Examined by High-Resolution X-ray Photoelectron Spectroscopy, Temperature-Programmed Desorption, Scanning Tunneling Microscopy, and Density Functional Theory

[Image: see text] Ultrathin (∼3 Å) zirconium oxide films were grown on a single-crystalline Pt(3)Zr(0001) substrate by oxidation in 1 × 10(–7) mbar of O(2) at 673 K, followed by annealing at temperatures up to 1023 K. The ZrO(2) films are intended to serve as model supports for reforming catalysts a...

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Detalles Bibliográficos
Autores principales: Li, Hao, Choi, Joong-Il Jake, Mayr-Schmölzer, Wernfried, Weilach, Christian, Rameshan, Christoph, Mittendorfer, Florian, Redinger, Josef, Schmid, Michael, Rupprechter, Günther
Formato: Online Artículo Texto
Lenguaje:English
Publicado: American Chemical Society 2014
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4321327/
https://www.ncbi.nlm.nih.gov/pubmed/25688293
http://dx.doi.org/10.1021/jp5100846

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4321327/
https://www.ncbi.nlm.nih.gov/pubmed/25688293
http://dx.doi.org/10.1021/jp5100846

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