Iterative deconvolution technique for measurements of diffraction-limited images on optical microscopes

Diffraction limit is usually a thorny problem in an optical inspection system. In this investigation, a model-based deconvolution technique was developed to recover diffraction-limited images, where images with sizes smaller than the diffraction limit could be recognized. Experiments were carried ou...

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Detalles Bibliográficos
Autores principales: Lu, Wenlong, Chang, Ming, Chen, Po-Cheng, Luo, Wun-Mao
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Taylor & Francis 2014
Materias:
Research Articles
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4330817/
https://www.ncbi.nlm.nih.gov/pubmed/25774075
http://dx.doi.org/10.1080/09500340.2014.924596

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4330817/
https://www.ncbi.nlm.nih.gov/pubmed/25774075
http://dx.doi.org/10.1080/09500340.2014.924596

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