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Iterative deconvolution technique for measurements of diffraction-limited images on optical microscopes
Diffraction limit is usually a thorny problem in an optical inspection system. In this investigation, a model-based deconvolution technique was developed to recover diffraction-limited images, where images with sizes smaller than the diffraction limit could be recognized. Experiments were carried ou...
Autores principales: | Lu, Wenlong, Chang, Ming, Chen, Po-Cheng, Luo, Wun-Mao |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Taylor & Francis
2014
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4330817/ https://www.ncbi.nlm.nih.gov/pubmed/25774075 http://dx.doi.org/10.1080/09500340.2014.924596 |
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