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XFEL diffraction: developing processing methods to optimize data quality
Serial crystallography, using either femtosecond X-ray pulses from free-electron laser sources or short synchrotron-radiation exposures, has the potential to reveal metalloprotein structural details while minimizing damage processes. However, deriving a self-consistent set of Bragg intensities from...
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
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International Union of Crystallography
2015
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4344359/ https://www.ncbi.nlm.nih.gov/pubmed/25723925 http://dx.doi.org/10.1107/S1600577514028203 |