Determining Chemically and Spatially Resolved Atomic Profile of Low Contrast Interface Structure with High Resolution

We present precise measurements of atomic distributions of low electron density contrast at a buried interface using soft x-ray resonant scattering. This approach allows one to construct chemically and spatially highly resolved atomic distribution profile upto several tens of nanometer in a non-dest...

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Detalles Bibliográficos
Autores principales: Nayak, Maheswar, Pradhan, P. C., Lodha, G. S.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2015
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4345341/
https://www.ncbi.nlm.nih.gov/pubmed/25726866
http://dx.doi.org/10.1038/srep08618

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4345341/
https://www.ncbi.nlm.nih.gov/pubmed/25726866
http://dx.doi.org/10.1038/srep08618

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