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Determining Chemically and Spatially Resolved Atomic Profile of Low Contrast Interface Structure with High Resolution
We present precise measurements of atomic distributions of low electron density contrast at a buried interface using soft x-ray resonant scattering. This approach allows one to construct chemically and spatially highly resolved atomic distribution profile upto several tens of nanometer in a non-dest...
Autores principales: | Nayak, Maheswar, Pradhan, P. C., Lodha, G. S. |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Publishing Group
2015
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Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4345341/ https://www.ncbi.nlm.nih.gov/pubmed/25726866 http://dx.doi.org/10.1038/srep08618 |
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