Improving Atomic Force Microscopy Imaging by a Direct Inverse Asymmetric PI Hysteresis Model

A modified Prandtl–Ishlinskii (PI) model, referred to as a direct inverse asymmetric PI (DIAPI) model in this paper, was implemented to reduce the displacement error between a predicted model and the actual trajectory of a piezoelectric actuator which is commonly found in AFM systems. Due to the non...

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Detalles Bibliográficos
Autores principales: Wang, Dong, Yu, Peng, Wang, Feifei, Chan, Ho-Yin, Zhou, Lei, Dong, Zaili, Liu, Lianqing, Li, Wen Jung
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2015
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4367365/
https://www.ncbi.nlm.nih.gov/pubmed/25654719
http://dx.doi.org/10.3390/s150203409

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4367365/
https://www.ncbi.nlm.nih.gov/pubmed/25654719
http://dx.doi.org/10.3390/s150203409

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