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Improving Atomic Force Microscopy Imaging by a Direct Inverse Asymmetric PI Hysteresis Model
A modified Prandtl–Ishlinskii (PI) model, referred to as a direct inverse asymmetric PI (DIAPI) model in this paper, was implemented to reduce the displacement error between a predicted model and the actual trajectory of a piezoelectric actuator which is commonly found in AFM systems. Due to the non...
| Autores principales: | , , , , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
MDPI
2015
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4367365/ https://www.ncbi.nlm.nih.gov/pubmed/25654719 http://dx.doi.org/10.3390/s150203409 |