Thickness Dispersion of Surface Plasmon of Ag Nano-thin Films: Determination by Ellipsometry Iterated with Transmittance Method

Effective optical constants of Ag thin films are precisely determined with effective thickness simultaneously by using an ellipsometry iterated with transmittance method. Unlike the bulk optical constants in Palik's database the effective optical constants of ultrathin Ag films are found to str...

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Detalles Bibliográficos
Autores principales: Gong, Junbo, Dai, Rucheng, Wang, Zhongping, Zhang, Zengming
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2015
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4369689/
https://www.ncbi.nlm.nih.gov/pubmed/25797217
http://dx.doi.org/10.1038/srep09279

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4369689/
https://www.ncbi.nlm.nih.gov/pubmed/25797217
http://dx.doi.org/10.1038/srep09279

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