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Dual beam organic depth profiling using large argon cluster ion beams
Argon cluster sputtering of an organic multilayer reference material consisting of two organic components, 4,4′-bis[N-(1-naphthyl-1-)-N-phenyl- amino]-biphenyl (NPB) and aluminium tris-(8-hydroxyquinolate) (Alq(3)), materials commonly used in organic light-emitting diodes industry, was carried out u...
| Autores principales: | , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
BlackWell Publishing Ltd
2014
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4376248/ https://www.ncbi.nlm.nih.gov/pubmed/25892830 http://dx.doi.org/10.1002/sia.5429 |