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Dual beam organic depth profiling using large argon cluster ion beams

Argon cluster sputtering of an organic multilayer reference material consisting of two organic components, 4,4′-bis[N-(1-naphthyl-1-)-N-phenyl- amino]-biphenyl (NPB) and aluminium tris-(8-hydroxyquinolate) (Alq(3)), materials commonly used in organic light-emitting diodes industry, was carried out u...

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Detalles Bibliográficos
Autores principales:	Holzweber, M, Shard, AG, Jungnickel, H, Luch, A, Unger, WES
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	BlackWell Publishing Ltd 2014
Materias:	Ecasia Special Issue Papers
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4376248/ https://www.ncbi.nlm.nih.gov/pubmed/25892830 http://dx.doi.org/10.1002/sia.5429

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