Atomic accuracy models from 4.5 Å cryo-electron microscopy data with density-guided iterative local refinement

Direct electron detectors have made it possible to generate electron density maps at near atomic resolution using cryo-electron microscopy single particle reconstructions. Critical current questions include how best to build models into these maps, how high quality a map is required to generate an a...

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Detalles Bibliográficos
Autores principales: DiMaio, Frank, Song, Yifan, Li, Xueming, Brunner, Matthias J., Xu, Chunfu, Conticello, Vincent, Egelman, Edward, Marlovits, Thomas, Cheng, Yifan, Baker, David
Formato: Online Artículo Texto
Lenguaje:English
Publicado: 2015
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4382417/
https://www.ncbi.nlm.nih.gov/pubmed/25707030
http://dx.doi.org/10.1038/nmeth.3286

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4382417/
https://www.ncbi.nlm.nih.gov/pubmed/25707030
http://dx.doi.org/10.1038/nmeth.3286

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