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Low Temperature Processed Complementary Metal Oxide Semiconductor (CMOS) Device by Oxidation Effect from Capping Layer
In this report, both p- and n-type tin oxide thin-film transistors (TFTs) were simultaneously achieved using single-step deposition of the tin oxide channel layer. The tuning of charge carrier polarity in the tin oxide channel is achieved by selectively depositing a copper oxide capping layer on top...
Autores principales: | Wang, Zhenwei, Al-Jawhari, Hala A., Nayak, Pradipta K., Caraveo-Frescas, J. A., Wei, Nini, Hedhili, M. N., Alshareef, H. N. |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Publishing Group
2015
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4402970/ https://www.ncbi.nlm.nih.gov/pubmed/25892711 http://dx.doi.org/10.1038/srep09617 |
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