Observing the morphology of single-layered embedded silicon nanocrystals by using temperature-stable TEM membranes

We use high-temperature-stable silicon nitride membranes to investigate single layers of silicon nanocrystal ensembles by energy filtered transmission electron microscopy. The silicon nanocrystals are prepared from the precipitation of a silicon-rich oxynitride layer sandwiched between two SiO(2) di...

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Detalles Bibliográficos
Autores principales: Gutsch, Sebastian, Hiller, Daniel, Laube, Jan, Zacharias, Margit, Kübel, Christian
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Beilstein-Institut 2015
Materias:
Full Research Paper
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4419582/
https://www.ncbi.nlm.nih.gov/pubmed/25977867
http://dx.doi.org/10.3762/bjnano.6.99

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4419582/
https://www.ncbi.nlm.nih.gov/pubmed/25977867
http://dx.doi.org/10.3762/bjnano.6.99

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