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Graphene on SiC(0001) inspected by dynamic atomic force microscopy at room temperature
We investigated single-layer graphene on SiC(0001) by atomic force and tunneling current microscopy, to separate the topographic and electronic contributions from the overall landscape. The analysis revealed that the roughness evaluated from the atomic force maps is very low, in accord with theoreti...
| Autores principales: | , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Beilstein-Institut
2015
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4419658/ https://www.ncbi.nlm.nih.gov/pubmed/25977861 http://dx.doi.org/10.3762/bjnano.6.93 |