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Graphene on SiC(0001) inspected by dynamic atomic force microscopy at room temperature

We investigated single-layer graphene on SiC(0001) by atomic force and tunneling current microscopy, to separate the topographic and electronic contributions from the overall landscape. The analysis revealed that the roughness evaluated from the atomic force maps is very low, in accord with theoreti...

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Detalles Bibliográficos
Autores principales:	Telychko, Mykola, Berger, Jan, Majzik, Zsolt, Jelínek, Pavel, Švec, Martin
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	Beilstein-Institut 2015
Materias:	Full Research Paper
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4419658/ https://www.ncbi.nlm.nih.gov/pubmed/25977861 http://dx.doi.org/10.3762/bjnano.6.93

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