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How little data is enough? Phase-diagram analysis of sparsity-regularized X-ray computed tomography
We introduce phase-diagram analysis, a standard tool in compressed sensing (CS), to the X-ray computed tomography (CT) community as a systematic method for determining how few projections suffice for accurate sparsity-regularized reconstruction. In CS, a phase diagram is a convenient way to study an...
| Autores principales: | , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
The Royal Society Publishing
2015
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4424483/ https://www.ncbi.nlm.nih.gov/pubmed/25939620 http://dx.doi.org/10.1098/rsta.2014.0387 |