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How little data is enough? Phase-diagram analysis of sparsity-regularized X-ray computed tomography

We introduce phase-diagram analysis, a standard tool in compressed sensing (CS), to the X-ray computed tomography (CT) community as a systematic method for determining how few projections suffice for accurate sparsity-regularized reconstruction. In CS, a phase diagram is a convenient way to study an...

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Detalles Bibliográficos
Autores principales: Jørgensen, J. S., Sidky, E. Y.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: The Royal Society Publishing 2015
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4424483/
https://www.ncbi.nlm.nih.gov/pubmed/25939620
http://dx.doi.org/10.1098/rsta.2014.0387

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