Role of Edge Inclination in an Optical Microdisk Resonator for Label-Free Sensing

In this paper, we report on the measurement and modeling of enhanced optical refractometric sensors based on whispering gallery modes. The devices under test are optical microresonators made of silicon nitride on silicon oxide, which differ in their sidewall inclination angle. In our approach, these...

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Detalles Bibliográficos
Autores principales: Gandolfi, Davide, Ramiro-Manzano, Fernando, Rebollo, Francisco Javier Aparicio, Ghulinyan, Mher, Pucker, Georg, Pavesi, Lorenzo
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2015
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4435147/
https://www.ncbi.nlm.nih.gov/pubmed/25730483
http://dx.doi.org/10.3390/s150304796

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4435147/
https://www.ncbi.nlm.nih.gov/pubmed/25730483
http://dx.doi.org/10.3390/s150304796

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