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Role of Edge Inclination in an Optical Microdisk Resonator for Label-Free Sensing
In this paper, we report on the measurement and modeling of enhanced optical refractometric sensors based on whispering gallery modes. The devices under test are optical microresonators made of silicon nitride on silicon oxide, which differ in their sidewall inclination angle. In our approach, these...
Autores principales: | , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2015
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4435147/ https://www.ncbi.nlm.nih.gov/pubmed/25730483 http://dx.doi.org/10.3390/s150304796 |
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author | Gandolfi, Davide Ramiro-Manzano, Fernando Rebollo, Francisco Javier Aparicio Ghulinyan, Mher Pucker, Georg Pavesi, Lorenzo |
author_facet | Gandolfi, Davide Ramiro-Manzano, Fernando Rebollo, Francisco Javier Aparicio Ghulinyan, Mher Pucker, Georg Pavesi, Lorenzo |
author_sort | Gandolfi, Davide |
collection | PubMed |
description | In this paper, we report on the measurement and modeling of enhanced optical refractometric sensors based on whispering gallery modes. The devices under test are optical microresonators made of silicon nitride on silicon oxide, which differ in their sidewall inclination angle. In our approach, these microresonators are vertically coupled to a buried waveguide with the aim of creating integrated and cost-effective devices. Device modeling shows that the optimization of the device is a delicate balance of the resonance quality factor and evanescent field overlap with the surrounding environment to analyze. By numerical simulations, we show that the microdisk thickness is critical to yield a high figure of merit for the sensor and that edge inclination should be kept as high as possible. We also show that bulk-sensing figures of merit as high as 1600 RIU(−1) (refractive index unit) are feasible. |
format | Online Article Text |
id | pubmed-4435147 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2015 |
publisher | MDPI |
record_format | MEDLINE/PubMed |
spelling | pubmed-44351472015-05-19 Role of Edge Inclination in an Optical Microdisk Resonator for Label-Free Sensing Gandolfi, Davide Ramiro-Manzano, Fernando Rebollo, Francisco Javier Aparicio Ghulinyan, Mher Pucker, Georg Pavesi, Lorenzo Sensors (Basel) Article In this paper, we report on the measurement and modeling of enhanced optical refractometric sensors based on whispering gallery modes. The devices under test are optical microresonators made of silicon nitride on silicon oxide, which differ in their sidewall inclination angle. In our approach, these microresonators are vertically coupled to a buried waveguide with the aim of creating integrated and cost-effective devices. Device modeling shows that the optimization of the device is a delicate balance of the resonance quality factor and evanescent field overlap with the surrounding environment to analyze. By numerical simulations, we show that the microdisk thickness is critical to yield a high figure of merit for the sensor and that edge inclination should be kept as high as possible. We also show that bulk-sensing figures of merit as high as 1600 RIU(−1) (refractive index unit) are feasible. MDPI 2015-02-26 /pmc/articles/PMC4435147/ /pubmed/25730483 http://dx.doi.org/10.3390/s150304796 Text en © 2015 by the authors; licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution license (http://creativecommons.org/licenses/by/4.0/). |
spellingShingle | Article Gandolfi, Davide Ramiro-Manzano, Fernando Rebollo, Francisco Javier Aparicio Ghulinyan, Mher Pucker, Georg Pavesi, Lorenzo Role of Edge Inclination in an Optical Microdisk Resonator for Label-Free Sensing |
title | Role of Edge Inclination in an Optical Microdisk Resonator for Label-Free Sensing |
title_full | Role of Edge Inclination in an Optical Microdisk Resonator for Label-Free Sensing |
title_fullStr | Role of Edge Inclination in an Optical Microdisk Resonator for Label-Free Sensing |
title_full_unstemmed | Role of Edge Inclination in an Optical Microdisk Resonator for Label-Free Sensing |
title_short | Role of Edge Inclination in an Optical Microdisk Resonator for Label-Free Sensing |
title_sort | role of edge inclination in an optical microdisk resonator for label-free sensing |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4435147/ https://www.ncbi.nlm.nih.gov/pubmed/25730483 http://dx.doi.org/10.3390/s150304796 |
work_keys_str_mv | AT gandolfidavide roleofedgeinclinationinanopticalmicrodiskresonatorforlabelfreesensing AT ramiromanzanofernando roleofedgeinclinationinanopticalmicrodiskresonatorforlabelfreesensing AT rebollofranciscojavieraparicio roleofedgeinclinationinanopticalmicrodiskresonatorforlabelfreesensing AT ghulinyanmher roleofedgeinclinationinanopticalmicrodiskresonatorforlabelfreesensing AT puckergeorg roleofedgeinclinationinanopticalmicrodiskresonatorforlabelfreesensing AT pavesilorenzo roleofedgeinclinationinanopticalmicrodiskresonatorforlabelfreesensing |